Magnification 30X TO 180X, Brand Olympus Semiconductor Flat Panel Display Inspection Microscopes, Model NameNumber TMM 210

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Olympus Industrial Metrology Lab, Quality Visual Inspection TMM 210
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Parameter Value
Brand Olympus
Magnification 30X TO 180X
Is It Portable Portable
Model Name/Number TMM 210
Usage/Application Industrial Metrology Lab, Quality Visual Inspection
Minimum Order Quantity 1

Product Description

Inspection Microscopes for Semiconductor and Flat Panel Display Quality Control

The mx63 and mx63l microscope systems are optimized for quality inspections of wafers as and other large samples, Circuit boards, Flat panel displays, Large as 300 mm. Their modular design empowers you to choose the components it's essential to tailor the system to your application. These ergonomic and user, Friendly microscopes help increase throughput while keeping inspectors comfortable while they do their work. Integrated with Olympus Stream imaging technology your entire, Analysis software workflow, Transitioning from insight to report creation, Can be simplified.

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Established: 1977
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